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Expert Bio

Primary Area of Expertise

Patent Infringement

Expert Witness Profile

Award winning, Oxford educated scientist whose areas of expertise include medical imaging, electronics, semiconductors, medical devices, sensors, MEMS, signal and image processing.

Dr. Daft has deposition and trial testimony experience. He has been involved in International Trade Commission (ITC) and USPTO Inter-Partes Review (IPR) matters. He completed more than 84 hours of specialized expert witness training courses.

Dr. Daft holds 23 issued U.S. Patents and has been involved in patent portfolio development and licensing.

His international consulting experience includes multi-nationals such as GE, Fujifilm, Medtronic, Samsung and Siemens as well as several start-ups. Dr. Daft is well published and has won research grants from National Institute of Health and DARPA.

He has three years' experience teaching electrical engineering at the University of Illinois.

Education & Licenses

BA, MA - Physics (Oxford University); Doctorate of Philosophy in Materials Science (Oxford University)