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Expert Bio

Primary Area of Expertise

Patent Infringement

Expert Witness Profile

Award winning, Oxford Educated scientist whose areas of expertise include medical imaging, electronics, semiconductors, medical devices, sensors, MEMS, biometric security, signal and image processing.

Extensive Intellectual Property experience in patent development, licensing and litigation. Completed more than 84 hours of SEAK Expert Witness training. 22 U.S. Patents issued.

Extensive international consulting experience includes multi-nationals such as GE, Fujifilm, Medtronic, Samsung and Siemens as well as several start-ups. Well published. Winner of grants from National Institute of Health and DARPA.

Three years' experience teaching electrical engineering. Holds BA and MA in Physics from Oxford and Doctorate from Oxford in Materials Science.

Education & Licenses

BA, MA - Physics (Oxford University); Doctorate of Philosophy in Materials Science (Oxford University)